Abstract: To address issues such as slow response time, complex calibration, and limited suitability for special environments in high-speed temperature measurements, a refrigeration-based high-speed IR temperature measurement system is designed with an STM32F429IGT6 microcontroller as the core controller and an optical system combined with a refrigeration-type IR detector as the main components. The optical system employs a metal parabolic reflector to construct the optical components. In conjunction with a refrigeration-type IR detector, photoelectric conversion is accomplished with high-speed data acquisition performed by the microcontroller. The system has a sampling rate of 1 MHz, utilizes an SD card for data storage, and displays the temperature-change waveforms on the screen. Temperature calibration is conducted using the blackbody furnace method, and a least squares fitting is applied to establish the voltage-temperature relationship formula, resulting in a measurement error of ±1℃. The effective temperature measurement range is 10-200℃. Following calibration, the system underwent Hopkinson pressure bar impact testing for practical application. The test results indicated that the refrigeration-based high-speed IR temperature measurement system possesses a microsecond-level detection capability for temperature changes, with a fast response time, simple operation, and calibration, thus demonstrating its promising applications in the field of dynamic high-speed temperature measurements.