ZHOU Lian-jun, ZOU Peng-cheng, LI Jin-hui, LI Yu, LI Xin-rong. The Analysis of Stress Using FEA for the Pixel Structure of Uncooled Microbolometer Arrays[J]. Infrared Technology , 2010, 32(2): 63-67. DOI: 10.3969/j.issn.1001-8891.2010.02.001
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Citation:
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ZHOU Lian-jun, ZOU Peng-cheng, LI Jin-hui, LI Yu, LI Xin-rong. The Analysis of Stress Using FEA for the Pixel Structure of Uncooled Microbolometer Arrays[J]. Infrared Technology , 2010, 32(2): 63-67. DOI: 10.3969/j.issn.1001-8891.2010.02.001
|
ZHOU Lian-jun, ZOU Peng-cheng, LI Jin-hui, LI Yu, LI Xin-rong. The Analysis of Stress Using FEA for the Pixel Structure of Uncooled Microbolometer Arrays[J]. Infrared Technology , 2010, 32(2): 63-67. DOI: 10.3969/j.issn.1001-8891.2010.02.001
|
Citation:
|
ZHOU Lian-jun, ZOU Peng-cheng, LI Jin-hui, LI Yu, LI Xin-rong. The Analysis of Stress Using FEA for the Pixel Structure of Uncooled Microbolometer Arrays[J]. Infrared Technology , 2010, 32(2): 63-67. DOI: 10.3969/j.issn.1001-8891.2010.02.001
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