WU Xian-quan, HUA Wen-shen, ZHAO Li-jun, XIE Da-bing, LI Xiao-ming. Study on Digitalized Resolution Testing of Infrared Up-conversion Thin Film[J]. Infrared Technology , 2010, 32(11): 632-635. DOI: 10.3969/j.issn.1001-8891.2010.11.004
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Citation:
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WU Xian-quan, HUA Wen-shen, ZHAO Li-jun, XIE Da-bing, LI Xiao-ming. Study on Digitalized Resolution Testing of Infrared Up-conversion Thin Film[J]. Infrared Technology , 2010, 32(11): 632-635. DOI: 10.3969/j.issn.1001-8891.2010.11.004
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WU Xian-quan, HUA Wen-shen, ZHAO Li-jun, XIE Da-bing, LI Xiao-ming. Study on Digitalized Resolution Testing of Infrared Up-conversion Thin Film[J]. Infrared Technology , 2010, 32(11): 632-635. DOI: 10.3969/j.issn.1001-8891.2010.11.004
|
Citation:
|
WU Xian-quan, HUA Wen-shen, ZHAO Li-jun, XIE Da-bing, LI Xiao-ming. Study on Digitalized Resolution Testing of Infrared Up-conversion Thin Film[J]. Infrared Technology , 2010, 32(11): 632-635. DOI: 10.3969/j.issn.1001-8891.2010.11.004
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