GENG Dong-feng, WANG Hai-zhen, LI Ming-hua, ZHENG Ke-lin. Study on Post-treatment Technology for the Surface of InSb Focal Plane Device[J]. Infrared Technology , 2011, 33(2): 96-99. DOI: 10.3969/j.issn.1001-8891.2011.02.007
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Citation:
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GENG Dong-feng, WANG Hai-zhen, LI Ming-hua, ZHENG Ke-lin. Study on Post-treatment Technology for the Surface of InSb Focal Plane Device[J]. Infrared Technology , 2011, 33(2): 96-99. DOI: 10.3969/j.issn.1001-8891.2011.02.007
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GENG Dong-feng, WANG Hai-zhen, LI Ming-hua, ZHENG Ke-lin. Study on Post-treatment Technology for the Surface of InSb Focal Plane Device[J]. Infrared Technology , 2011, 33(2): 96-99. DOI: 10.3969/j.issn.1001-8891.2011.02.007
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Citation:
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GENG Dong-feng, WANG Hai-zhen, LI Ming-hua, ZHENG Ke-lin. Study on Post-treatment Technology for the Surface of InSb Focal Plane Device[J]. Infrared Technology , 2011, 33(2): 96-99. DOI: 10.3969/j.issn.1001-8891.2011.02.007
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