Low Temperature Evaluation Method of Infrared Detector Integrated with Optical System

To test the low temperature MTF of infrared detectors integrated with an optical system inside a Dewar, a shell structure Dewar was designed. The inconvenient factors caused by the large size and complexity of the optical system is eliminated. The MTF test optical path was built to obtain the temperature distribution gradient of the integrated optical lens group, providing reliable data for the assembly accuracy and optical performance of the integrated optical lens group.