TIAN Li-ping, ZHU Ying-feng, LIU Xiang-yun, GUO Jian-hua. Back-thining on Reliability Influence for MW 320×256 MCT IRFPA[J]. Infrared Technology , 2013, (10): 629-631.
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Citation:
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TIAN Li-ping, ZHU Ying-feng, LIU Xiang-yun, GUO Jian-hua. Back-thining on Reliability Influence for MW 320×256 MCT IRFPA[J]. Infrared Technology , 2013, (10): 629-631.
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TIAN Li-ping, ZHU Ying-feng, LIU Xiang-yun, GUO Jian-hua. Back-thining on Reliability Influence for MW 320×256 MCT IRFPA[J]. Infrared Technology , 2013, (10): 629-631.
|
Citation:
|
TIAN Li-ping, ZHU Ying-feng, LIU Xiang-yun, GUO Jian-hua. Back-thining on Reliability Influence for MW 320×256 MCT IRFPA[J]. Infrared Technology , 2013, (10): 629-631.
|
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