HUANG Jiang-ping, FENG Jiang-min, WANG Yu, SU Yu-hui, XIN Si-shu, LI Yu-ying. Quality Control of the PZT Wafer Bonding in Pyroelectric Infrared Detector[J]. Infrared Technology , 2013, (12): 764-767.
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Citation:
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HUANG Jiang-ping, FENG Jiang-min, WANG Yu, SU Yu-hui, XIN Si-shu, LI Yu-ying. Quality Control of the PZT Wafer Bonding in Pyroelectric Infrared Detector[J]. Infrared Technology , 2013, (12): 764-767.
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HUANG Jiang-ping, FENG Jiang-min, WANG Yu, SU Yu-hui, XIN Si-shu, LI Yu-ying. Quality Control of the PZT Wafer Bonding in Pyroelectric Infrared Detector[J]. Infrared Technology , 2013, (12): 764-767.
|
Citation:
|
HUANG Jiang-ping, FENG Jiang-min, WANG Yu, SU Yu-hui, XIN Si-shu, LI Yu-ying. Quality Control of the PZT Wafer Bonding in Pyroelectric Infrared Detector[J]. Infrared Technology , 2013, (12): 764-767.
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