SUN Shi-wen, SUI Song-yin, HE Li, ZHOU Chang-he, YU Hui-xian, XU Chao. Characterization of Low-angleGrainBoundaryof CdZnTe Single Crystalsby X-ray Diffraction Topography in Reflection[J]. Infrared Technology , 2014, (7): 588-591.
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Citation:
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SUN Shi-wen, SUI Song-yin, HE Li, ZHOU Chang-he, YU Hui-xian, XU Chao. Characterization of Low-angleGrainBoundaryof CdZnTe Single Crystalsby X-ray Diffraction Topography in Reflection[J]. Infrared Technology , 2014, (7): 588-591.
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SUN Shi-wen, SUI Song-yin, HE Li, ZHOU Chang-he, YU Hui-xian, XU Chao. Characterization of Low-angleGrainBoundaryof CdZnTe Single Crystalsby X-ray Diffraction Topography in Reflection[J]. Infrared Technology , 2014, (7): 588-591.
|
Citation:
|
SUN Shi-wen, SUI Song-yin, HE Li, ZHOU Chang-he, YU Hui-xian, XU Chao. Characterization of Low-angleGrainBoundaryof CdZnTe Single Crystalsby X-ray Diffraction Topography in Reflection[J]. Infrared Technology , 2014, (7): 588-591.
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