CHEN Jing, CEHNG Hongchang, WU Lingling, FENG Liu, MIAO Zhuang. Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers[J]. Infrared Technology , 2017, 39(5): 463-468.
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Citation:
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CHEN Jing, CEHNG Hongchang, WU Lingling, FENG Liu, MIAO Zhuang. Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers[J]. Infrared Technology , 2017, 39(5): 463-468.
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CHEN Jing, CEHNG Hongchang, WU Lingling, FENG Liu, MIAO Zhuang. Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers[J]. Infrared Technology , 2017, 39(5): 463-468.
|
Citation:
|
CHEN Jing, CEHNG Hongchang, WU Lingling, FENG Liu, MIAO Zhuang. Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers[J]. Infrared Technology , 2017, 39(5): 463-468.
|
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