BAI Xiaofeng, GUO Hui, YANG Shuning, ZHU Yufeng, SHI Feng, HOU Zhipeng, HUANG Wujun, MENG Qingyun. Integral Sensitivity Measurement Technique for Accurately Predicting the Lifetime of a Low-light-level Image Intensifier[J]. Infrared Technology , 2018, 40(12): 1121-1124.
|
Citation:
|
BAI Xiaofeng, GUO Hui, YANG Shuning, ZHU Yufeng, SHI Feng, HOU Zhipeng, HUANG Wujun, MENG Qingyun. Integral Sensitivity Measurement Technique for Accurately Predicting the Lifetime of a Low-light-level Image Intensifier[J]. Infrared Technology , 2018, 40(12): 1121-1124.
|
BAI Xiaofeng, GUO Hui, YANG Shuning, ZHU Yufeng, SHI Feng, HOU Zhipeng, HUANG Wujun, MENG Qingyun. Integral Sensitivity Measurement Technique for Accurately Predicting the Lifetime of a Low-light-level Image Intensifier[J]. Infrared Technology , 2018, 40(12): 1121-1124.
|
Citation:
|
BAI Xiaofeng, GUO Hui, YANG Shuning, ZHU Yufeng, SHI Feng, HOU Zhipeng, HUANG Wujun, MENG Qingyun. Integral Sensitivity Measurement Technique for Accurately Predicting the Lifetime of a Low-light-level Image Intensifier[J]. Infrared Technology , 2018, 40(12): 1121-1124.
|
DownLoad: