Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering

ZHANG Qingyu; FAN Yugang; GAO Yang

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Issue 10

Dec. 2020

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Infrared Technology > 2020 > 42(10): 1001-1006.

ZHANG Qingyu, FAN Yugang, GAO Yang. Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering[J]. Infrared Technology , 2020, 42(10): 1001-1006.

Citation:

ZHANG Qingyu, FAN Yugang, GAO Yang. Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering[J]. Infrared Technology , 2020, 42(10): 1001-1006.

Citation:

ZHANG Qingyu, FAN Yugang, GAO Yang. Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering[J]. Infrared Technology , 2020, 42(10): 1001-1006.

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